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Title: haiic 34 mock test online practice
Page Link: haiic 34 mock test online practice -
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Created at: Monday 22nd of August 2016 08:23:19 PM
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Title: A microprocessor-based generator of synchronizing signal and test signal for colour T
Page Link: A microprocessor-based generator of synchronizing signal and test signal for colour T -
Posted By: Electrical Fan
Created at: Sunday 04th of October 2009 05:44:14 PM
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Abstract Test card for color TV is a widely used method to evaluate the quality of a TV set directly. We have made a test signal generator (which can also generate synchronizing (abbreviated to sync hereafter) signals) mainly based on microprocessor Z-80. Taking the advantage of microprocessor programming, combining with the technique of microprocessor, digital circuits and analogue devices, we use software as far as possible to generate signals directly or to simplify the controlling circuits. Those signals, such as composite sync signal, bla ....etc

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Title: ic 34 mock test online practice
Page Link: ic 34 mock test online practice -
Posted By:
Created at: Sunday 31st of May 2015 03:52:43 PM
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Title: INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPME
Page Link: INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPME -
Posted By: computer science crazy
Created at: Thursday 17th of September 2009 04:30:56 AM
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INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPMENT.

It is designed and developed based on microprocessor technology for Konkurs Missile Test Equipment (KMTE) assembled on a PCB module mounted on a bracket, in turn to be fitted on front panel PCB frame of test equipment.

Charger is intended to charge Ni-Cd/Ni-Al battery pack capacity of 1.8AH/2.2AH respectively. It shall operate on AC mains power of 230V AC at 50Hz with specified variation. The regulated power supply of charger works on SMPS and convert ....etc

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Title: ic 34 mock test
Page Link: ic 34 mock test -
Posted By:
Created at: Thursday 29th of November 2012 01:58:00 PM
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I NEED IC34 MOCK TEST TO ATTEND THE EXAM OF GENERAL INSURANCE ORIENTAL INSURANCE COMPANY
THANKING YOU
WITH REGARDS
B.P.SHIVA SHANKAR
BANGALORE ....etc

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Title: ic 34 mock test
Page Link: ic 34 mock test -
Posted By:
Created at: Thursday 29th of November 2012 04:46:59 PM
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Title: TEST PLATFORM FOR SECURE WIRELESS COMMUNICATION USING XTEA
Page Link: TEST PLATFORM FOR SECURE WIRELESS COMMUNICATION USING XTEA -
Posted By: computer science crazy
Created at: Friday 18th of September 2009 12:30:02 AM
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TEST PLATFORM FOR SECURE WIRELESS COMMUNICATION USING XTEA

Abstract:- In this paper we present a new methodology for the integration of security provisions into protocols for wireless sensor networks. There is an ever-growing demand for security in communications in general. As wireless sensor networks (WSN) face real-world applications the authenticity of the retrieved data has to be guaranteed. To facilitate integration of security provisions into WSNs the platform TAP-SNS (Testing Algorithms and Protocols for Sensor Network Security) enab ....etc

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Title: oriental insurance mock test
Page Link: oriental insurance mock test -
Posted By:
Created at: Tuesday 28th of July 2015 05:14:24 PM
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Dear Sir,

I want to see mock test papers for online exam of Para 13.2 for A.O. I am an employee of oriental co. so I want mock test papers Paper I for marine, misc and fire and also Paper II for GK and Englsh papers .


Mr. Prakash V. Mandavkar ....etc

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Title: BUILT IN SELF TEST FOR A CMOS ALU
Page Link: BUILT IN SELF TEST FOR A CMOS ALU -
Posted By: computer science crazy
Created at: Friday 18th of September 2009 12:26:27 AM
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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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Title: Correlation of Sinusoidal Sweep Test to Field Random Vibrations
Page Link: Correlation of Sinusoidal Sweep Test to Field Random Vibrations -
Posted By: mechanical wiki
Created at: Tuesday 08th of September 2009 06:53:46 PM
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The vibration load subjected to many products is the combination of several random processes corresponding to different application conditions, such as the various field road load inputs for automotive components. Sometimes the input loads are the combination of random and sinusoidal vibration. Due to the convenience of test setup and monitoring, the sinusoidal vibration sweep tests are often used for product durability validation by many automotive and consumer product manufacturers. It is therefore important to correctly correlate the sweep ....etc

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