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Title: A microprocessor-based generator of synchronizing signal and test signal for colour T
Page Link: A microprocessor-based generator of synchronizing signal and test signal for colour T -
Posted By: Electrical Fan
Created at: Sunday 04th of October 2009 05:44:14 PM
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Abstract Test card for color TV is a widely used method to evaluate the quality of a TV set directly. We have made a test signal generator (which can also generate synchronizing (abbreviated to sync hereafter) signals) mainly based on microprocessor Z-80. Taking the advantage of microprocessor programming, combining with the technique of microprocessor, digital circuits and analogue devices, we use software as far as possible to generate signals directly or to simplify the controlling circuits. Those signals, such as composite sync signal, bla ....etc

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Title: Correlation of Sinusoidal Sweep Test to Field Random Vibrations
Page Link: Correlation of Sinusoidal Sweep Test to Field Random Vibrations -
Posted By: mechanical wiki
Created at: Tuesday 08th of September 2009 06:53:46 PM
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The vibration load subjected to many products is the combination of several random processes corresponding to different application conditions, such as the various field road load inputs for automotive components. Sometimes the input loads are the combination of random and sinusoidal vibration. Due to the convenience of test setup and monitoring, the sinusoidal vibration sweep tests are often used for product durability validation by many automotive and consumer product manufacturers. It is therefore important to correctly correlate the sweep ....etc

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Title: BUILT IN SELF TEST FOR A CMOS ALU
Page Link: BUILT IN SELF TEST FOR A CMOS ALU -
Posted By: computer science crazy
Created at: Friday 18th of September 2009 12:26:27 AM
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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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Title: infaraaed data assocatioIrDA
Page Link: infaraaed data assocatioIrDA -
Posted By: kiranmurkal
Created at: Tuesday 02nd of March 2010 01:27:05 PM
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Title: TEST PLATFORM FOR SECURE WIRELESS COMMUNICATION USING XTEA
Page Link: TEST PLATFORM FOR SECURE WIRELESS COMMUNICATION USING XTEA -
Posted By: computer science crazy
Created at: Friday 18th of September 2009 12:30:02 AM
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TEST PLATFORM FOR SECURE WIRELESS COMMUNICATION USING XTEA

Abstract:- In this paper we present a new methodology for the integration of security provisions into protocols for wireless sensor networks. There is an ever-growing demand for security in communications in general. As wireless sensor networks (WSN) face real-world applications the authenticity of the retrieved data has to be guaranteed. To facilitate integration of security provisions into WSNs the platform TAP-SNS (Testing Algorithms and Protocols for Sensor Network Security) enab ....etc

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Title: ic34mock test
Page Link: ic34mock test -
Posted By:
Created at: Sunday 28th of August 2016 01:26:48 PM
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Title: Undecidability Results in Turing Test
Page Link: Undecidability Results in Turing Test -
Posted By: nit_cal
Created at: Friday 30th of October 2009 06:56:38 PM
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Presented by:Amaldev M.
Undecidability Results in Turing Test

Abstract
The turing test is one of the most disputed topics in artificial intelligence, philosophy of mind, and cognitive science. This seminar covers the major undeeidability results and supporting facts that had been claimed or proved against the test.

Introduction

1.1 'Can machines think'
I Propose to consider the question, 'Ca ....etc

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Title: irda ppt presentation
Page Link: irda ppt presentation -
Posted By:
Created at: Friday 05th of October 2012 07:40:46 PM
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Title: Automatic Test Case Generation Using Message Sequence ChartsMSCs
Page Link: Automatic Test Case Generation Using Message Sequence ChartsMSCs -
Posted By: nit_cal
Created at: Friday 30th of October 2009 05:45:48 PM
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Abstract
This work extends the study done in the area of Message Sequence charts(MSCs) towards the automation of testing including testing the design of a system.An al- gorithm used for generating the test cases from the design speci¯cation is also developed. Our work proposes an approach to generate test cases from a set of Message Sequence Charts (MSCs) by constructing a semantically equivalent ¯nite state machine for testing reactive and embedded software. Test cases are expressed as a sequence of messages to be exchanged a ....etc

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Title: INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPME
Page Link: INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPME -
Posted By: computer science crazy
Created at: Thursday 17th of September 2009 04:30:56 AM
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INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPMENT.

It is designed and developed based on microprocessor technology for Konkurs Missile Test Equipment (KMTE) assembled on a PCB module mounted on a bracket, in turn to be fitted on front panel PCB frame of test equipment.

Charger is intended to charge Ni-Cd/Ni-Al battery pack capacity of 1.8AH/2.2AH respectively. It shall operate on AC mains power of 230V AC at 50Hz with specified variation. The regulated power supply of charger works on SMPS and convert ....etc

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