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Title: Batteries built with genetically modified viruses
Page Link: Batteries built with genetically modified viruses -
Posted By: project report tiger
Created at: Saturday 06th of February 2010 02:08:41 AM
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potential power aid by a harmless viruses called bacteriophages its a genetically manipulate viruses to build structures packed with tiny conductive wires would replace lithium ion with thin stucture future.The DNA of the virus producing an organism with surface proteins designed to attract particles of cobalt and gold. a solution containing the metal- loving viruses to a silicon slide coated with alternating layers of negatively and positively charged polymers.and a transparent film about 10 centimeters by 10 centimeters, containing about a b ....etc

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Title: vox projector led blinking but projector not working
Page Link: vox projector led blinking but projector not working -
Posted By:
Created at: Friday 16th of August 2013 03:30:57 PM
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vox projector led blinking but projector not working
vox projector led blinking but projector not working ....etc

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Title: Design and Development of Multi-Channel Data Logger for Built Environment
Page Link: Design and Development of Multi-Channel Data Logger for Built Environment -
Posted By: seminar class
Created at: Thursday 05th of May 2011 05:20:35 PM
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Abstract
In this paper, an effort has been made todesign and developed a 4-channel data logger for indoorenvironment. Initially the present work hasconcentrated to environmental parameter (temperatureand humidity) and more polluted contaminants(concentration level of CO and CO2). The Data logger isproposed to be developed with the use ofmicrocontroller PIC 18F4458 (inbuilt 8 channel ADC),i.e. 4 channels will be used and 4 channel will open inexternal sensor. Real Time Clock is also interfaced forsampled data with the instance of sampli ....etc

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Title: Built In Self Test of FPGA
Page Link: Built In Self Test of FPGA -
Posted By: renuprasad.rvpb
Created at: Tuesday 14th of June 2011 06:40:24 PM
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Hi.. I m Prasad MC, can anyone please send me the report and code for Built In Self Test of Configurable Logic Blocks of FPGA.... Thank you..... ....etc

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Title: Driving and the Built Environment The Effects of Compact Development on Motorized Tr
Page Link: Driving and the Built Environment The Effects of Compact Development on Motorized Tr -
Posted By: Electrical Fan
Created at: Thursday 03rd of September 2009 07:13:09 AM
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Driving and the Built Environment: Effects of Compact Development on Motorized Travel, Energy Use, and CO2 Emissions examines the relationship between land development patterns and vehicle miles traveled (VMT) in the United States to assess whether petroleum use, and by extension greenhouse gas (GHG) emissions, could be reduced by changes in the design of development patterns. The report estimates the contributions that changes in residential and mixed-use development patterns and transit investments could make in reducing VMT by 2030 and 20 ....etc

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Title: SQL Builtins Pocket Reference
Page Link: SQL Builtins Pocket Reference -
Posted By: seminar paper
Created at: Saturday 03rd of March 2012 05:07:30 PM
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SQL Built−ins Pocket Reference



Introduction
The Oracle PL/SQL Built−ins Pocket Reference is a quick reference guide to the many built−in packages and
functions provided by Oracle Corporation. It contains a concise description of the syntax for the following:
· Built−in packages
· Built−in functions
· RESTRICT REFERENCES pragmas for the built−in packages
· Nonprogram elements (e.g., constants, exceptions, etc.) defined in the built−in ....etc

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Title: BUILT IN SELF TEST FOR A CMOS ALU
Page Link: BUILT IN SELF TEST FOR A CMOS ALU -
Posted By: computer science crazy
Created at: Friday 18th of September 2009 12:26:27 AM
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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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Title: Built-In Self-Test and Calibration of Mixed-Signal Devices
Page Link: Built-In Self-Test and Calibration of Mixed-Signal Devices -
Posted By: project uploader
Created at: Wednesday 07th of March 2012 02:49:41 PM
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Built-In Self-Test and Calibration of Mixed-Signal Devices


Outline
Introduction
Background
BIST Architecture for Mixed-Signal Devices
Overview of Proposed Architecture
Test of DAC/ADC
Calibration of DAC
Sigma-Delta Modulation
Polynomial Fitting Algorithm
Conclusion
Motivation
Digital BIST techniques
Defect-oriented
Logic BIST, scan chain, boundary scan, JTAG, etc
Mixed-Signal BIST techniques
Specification-oriented
No universally accepted standard
Issues
Parameter deviation
Process variation

App ....etc

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Title: Design and Implementation of BUILT IN SELF TEST BIST
Page Link: Design and Implementation of BUILT IN SELF TEST BIST -
Posted By: project report helper
Created at: Monday 27th of September 2010 06:15:35 PM
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Design and Implementation of BUILT IN SELF TEST (BIST)

Abstract

The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have no choice but to accept new responsibilities that had been performed by groups of technicians in the previous years. Design engineers who do not design systems with full testability in mind open themselves to the increased possibility of product failures and missed market opportunities. BIST is a design technique that allows a circ ....etc

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Title: how random access memory is built up
Page Link: how random access memory is built up -
Posted By: MANMANMAN
Created at: Saturday 24th of September 2011 03:35:40 AM
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