Hi.. I m Prasad MC, can anyone please send me the report and code for Built In Self Test of Configurable Logic Blocks of FPGA.... Thank you..... ....etc

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SQL Built−ins Pocket Reference



Introduction
The Oracle PL/SQL Built−ins Pocket Reference is a quick reference guide to the many built−in packages and
functions provided by Oracle Corporation. It contains a concise description of the syntax for the following:
· Built−in packages
· Built−in functions
· RESTRICT REFERENCES pragmas for the built−in packages
· Nonprogram elements (e.g., constants, exceptions, etc.) defined in the built−in ....etc

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Abstract
In this paper, an effort has been made todesign and developed a 4-channel data logger for indoorenvironment. Initially the present work hasconcentrated to environmental parameter (temperatureand humidity) and more polluted contaminants(concentration level of CO and CO2). The Data logger isproposed to be developed with the use ofmicrocontroller PIC 18F4458 (inbuilt 8 channel ADC),i.e. 4 channels will be used and 4 channel will open inexternal sensor. Real Time Clock is also interfaced forsampled data with the instance of sampli ....etc

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Design and Implementation of BUILT IN SELF TEST (BIST)

Abstract
The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have no choice but to accept new responsibilities that had been performed by groups of technicians in the previous years. Design engineers who do not design systems with full testability in mind open themselves to the increased possibility of product failures and missed market opportunities. BIST is a design technique that allows a circ ....etc

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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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potential power aid by a harmless viruses called bacteriophages its a genetically manipulate viruses to build structures packed with tiny conductive wires would replace lithium ion with thin stucture future.The DNA of the virus producing an organism with surface proteins designed to attract particles of cobalt and gold. a solution containing the metal- loving viruses to a silicon slide coated with alternating layers of negatively and positively charged polymers.and a transparent film about 10 centimeters by 10 centimeters, containing about a b ....etc

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details on Random access memory
1.its manufacture
2.its design
3.seminars on RAM ....etc

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Hii....
I want paper presentation on built in test intelligence system design or any other topic related to it... Please provide it on my gmail account [email protected]...

Regards ....etc

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Driving and the Built Environment: Effects of Compact Development on Motorized Travel, Energy Use, and CO2 Emissions examines the relationship between land development patterns and vehicle miles traveled (VMT) in the United States to assess whether petroleum use, and by extension greenhouse gas (GHG) emissions, could be reduced by changes in the design of development patterns. The report estimates the contributions that changes in residential and mixed-use development patterns and transit investments could make in reducing VMT by 2030 and 20 ....etc

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Built-In Self-Test and Calibration of Mixed-Signal Devices


Outline
Introduction
Background
BIST Architecture for Mixed-Signal Devices
Overview of Proposed Architecture
Test of DAC/ADC
Calibration of DAC
Sigma-Delta Modulation
Polynomial Fitting Algorithm
Conclusion
Motivation
Digital BIST techniques
Defect-oriented
Logic BIST, scan chain, boundary scan, JTAG, etc
Mixed-Signal BIST techniques
Specification-oriented
No universally accepted standard
Issues
Parameter deviation
Process variation

App ....etc

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