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Title: haiic 34 mock test online practice
Page Link: haiic 34 mock test online practice -
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Posted By: kiranmurkal
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Title: oriental insurance mock test
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Title: Correlation of Sinusoidal Sweep Test to Field Random Vibrations
Page Link: Correlation of Sinusoidal Sweep Test to Field Random Vibrations -
Posted By: mechanical wiki
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The vibration load subjected to many products is the combination of several random processes corresponding to different application conditions, such as the various field road load inputs for automotive components. Sometimes the input loads are the combination of random and sinusoidal vibration. Due to the convenience of test setup and monitoring, the sinusoidal vibration sweep tests are often used for product durability validation by many automotive and consumer product manufacturers. It is therefore important to correctly correlate the sweep ....etc

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Title: INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPME
Page Link: INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPME -
Posted By: computer science crazy
Created at: Thursday 17th of September 2009 04:30:56 AM
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INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPMENT.

It is designed and developed based on microprocessor technology for Konkurs Missile Test Equipment (KMTE) assembled on a PCB module mounted on a bracket, in turn to be fitted on front panel PCB frame of test equipment.

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Title: ic 34 mock test
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Created at: Thursday 29th of November 2012 04:46:59 PM
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Title: ic 34 mock test
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Created at: Thursday 29th of November 2012 01:58:00 PM
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Title: BUILT IN SELF TEST FOR A CMOS ALU
Page Link: BUILT IN SELF TEST FOR A CMOS ALU -
Posted By: computer science crazy
Created at: Friday 18th of September 2009 12:26:27 AM
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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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Title: ic 34 mock test online practice
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