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Title: History of 64-bit Computing AMD64 and Intel Itanium Processors 64-bit History
Page Link: History of 64-bit Computing AMD64 and Intel Itanium Processors 64-bit History -
Posted By: seminar class
Created at: Monday 28th of February 2011 12:02:21 PM
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History of 64-bit Computing: AMD64 and Intel Itanium Processors
64-bit History

• “640K ought to be enough for anybody” – Bill Gates
• 64-bit twice as fast as 32-bits?
• Benefits of 64-bit technology
• Applications of 64-bit technology
AMD64 Outline
• AMD Athlon 64 Specifications
• Operating Modes
• Register overview
• DDR controller and Hypertransport
AMD Athlon 64 Specifications
Infrastructure Socket 754
Number of Transistors 105.9 million
64-bit Instruction Set ....etc

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Title: Batteries built with genetically modified viruses
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Posted By: project report tiger
Created at: Saturday 06th of February 2010 02:08:41 AM
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Title: improving electrical system reliability with infrared thermography doc
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Created at: Friday 14th of March 2014 06:08:20 PM
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Title: Driving and the Built Environment The Effects of Compact Development on Motorized Tr
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Posted By: Electrical Fan
Created at: Thursday 03rd of September 2009 07:13:09 AM
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Driving and the Built Environment: Effects of Compact Development on Motorized Travel, Energy Use, and CO2 Emissions examines the relationship between land development patterns and vehicle miles traveled (VMT) in the United States to assess whether petroleum use, and by extension greenhouse gas (GHG) emissions, could be reduced by changes in the design of development patterns. The report estimates the contributions that changes in residential and mixed-use development patterns and transit investments could make in reducing VMT by 2030 and 20 ....etc

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Title: Built In Self Test of FPGA
Page Link: Built In Self Test of FPGA -
Posted By: renuprasad.rvpb
Created at: Tuesday 14th of June 2011 06:40:24 PM
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Hi.. I m Prasad MC, can anyone please send me the report and code for Built In Self Test of Configurable Logic Blocks of FPGA.... Thank you..... ....etc

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Title: Design and Implementation of BUILT IN SELF TEST BIST
Page Link: Design and Implementation of BUILT IN SELF TEST BIST -
Posted By: project report helper
Created at: Monday 27th of September 2010 06:15:35 PM
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Design and Implementation of BUILT IN SELF TEST (BIST)

Abstract

The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have no choice but to accept new responsibilities that had been performed by groups of technicians in the previous years. Design engineers who do not design systems with full testability in mind open themselves to the increased possibility of product failures and missed market opportunities. BIST is a design technique that allows a circ ....etc

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Title: BUILT IN SELF TEST FOR A CMOS ALU
Page Link: BUILT IN SELF TEST FOR A CMOS ALU -
Posted By: computer science crazy
Created at: Friday 18th of September 2009 12:26:27 AM
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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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Title: 16-bit Booth Multiplier with 32-bit Accumulate
Page Link: 16-bit Booth Multiplier with 32-bit Accumulate -
Posted By: seminar surveyer
Created at: Thursday 07th of October 2010 02:18:41 PM
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Introduction

This report presents three main topics we investigated as part of a project to build a Booth encoded multiply/accumulate VLSI chip. The original scope of work included synthesizing VHDL code using the Mentor Graphics tools. Exemplar was the VHDL compiler. Leonardo Spectrum was the synthesizer. Since my team, which included Kevin Delaney, did not meet a Mosis deadline our chip funding was lost. Since we did not actually fabricate a chip, we cannot discuss the success of our results. Likewise, VHDL synthesis using the ....etc

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Title: reliability bit built in test doc
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Posted By:
Created at: Wednesday 21st of November 2012 02:50:27 AM
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Title: Built-In Self-Test and Calibration of Mixed-Signal Devices
Page Link: Built-In Self-Test and Calibration of Mixed-Signal Devices -
Posted By: project uploader
Created at: Wednesday 07th of March 2012 02:49:41 PM
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Built-In Self-Test and Calibration of Mixed-Signal Devices


Outline
Introduction
Background
BIST Architecture for Mixed-Signal Devices
Overview of Proposed Architecture
Test of DAC/ADC
Calibration of DAC
Sigma-Delta Modulation
Polynomial Fitting Algorithm
Conclusion
Motivation
Digital BIST techniques
Defect-oriented
Logic BIST, scan chain, boundary scan, JTAG, etc
Mixed-Signal BIST techniques
Specification-oriented
No universally accepted standard
Issues
Parameter deviation
Process variation

App ....etc

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