Abstract Test card for color TV is a widely used method to evaluate the quality of a TV set directly. We have made a test signal generator (which can also generate synchronizing (abbreviated to sync hereafter) signals) mainly based on microprocessor Z-80. Taking the advantage of microprocessor programming, combining with the technique of microprocessor, digital circuits and analogue devices, we use software as far as possible to generate signals directly or to simplify the controlling circuits. Those signals, such as composite sync signal, bla..............etc

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Abstract
This paper presents an analytic current model for capacitively coupled Single-Electron Tunneling Transistors (SETTs) that is based on a modified M-state steady-state master equation. Based on this current model we also derive a current noise model for SETT. To validate the proposed models we calculate their characteristics at different device parameters and different operation temperatures and compare them with the corresponding characteristics calculated by the full master equation method. The results indicate that the propo..............etc

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How hopkinson test is done...in which parameter it depend...and abstract for hopkinson test..............etc

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Abstract
According to the relevant IEC standards vacuumcircuit-breakers have to meet various needs, e.g. theinterruption capability, making operations, and dielectricstrength. Switching of capacitor banks, overhead lines, orcables leads to very small currents in comparison withshort-circuit currents. After current interruption thecircuit-breaker must withstand twice the peak value of thesystem voltage. Furthermore, restrikes can lead to voltagemultiplication. The conjunction of relatively smallbreaking currents with high voltage stress..............etc

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INTELLIGENT BATTERY CHARGING USING PIC16F73 MICRO CONTROLLER FOR MISSILE TEST EQUIPMENT.

It is designed and developed based on microprocessor technology for Konkurs Missile Test Equipment (KMTE) assembled on a PCB module mounted on a bracket, in turn to be fitted on front panel PCB frame of test equipment.

Charger is intended to charge Ni-Cd/Ni-Al battery pack capacity of 1.8AH/2.2AH respectively. It shall operate on AC mains power of 230V AC at 50Hz with specified variation. The regulated power supply of charger works on SMPS and convert..............etc

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Abstract
This work extends the study done in the area of Message Sequence charts(MSCs) towards the automation of testing including testing the design of a system.An al- gorithm used for generating the test cases from the design speci¯cation is also developed. Our work proposes an approach to generate test cases from a set of Message Sequence Charts (MSCs) by constructing a semantically equivalent ¯nite state machine for testing reactive and embedded software. Test cases are expressed as a sequence of messages to be exchanged a..............etc

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TEST PLATFORM FOR SECURE WIRELESS COMMUNICATION USING XTEA

Abstract:- In this paper we present a new methodology for the integration of security provisions into protocols for wireless sensor networks. There is an ever-growing demand for security in communications in general. As wireless sensor networks (WSN) face real-world applications the authenticity of the retrieved data has to be guaranteed. To facilitate integration of security provisions into WSNs the platform TAP-SNS (Testing Algorithms and Protocols for Sensor Network Security) enab..............etc

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demerit and merit of four quadrant d.c
drive
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The vibration load subjected to many products is the combination of several random processes corresponding to different application conditions, such as the various field road load inputs for automotive components. Sometimes the input loads are the combination of random and sinusoidal vibration. Due to the convenience of test setup and monitoring, the sinusoidal vibration sweep tests are often used for product durability validation by many automotive and consumer product manufacturers. It is therefore important to correctly correlate the sweep ..............etc

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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati..............etc

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