A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity
This paper appears in:
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Date of Publication: Nov. 2011
Author(s): Mostafa, H.
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
Anis, M. ; Elmasry, M.
Volume: 19 , Issue: 11
Page(s): 2130 - 2134
Product Type: Journals & Magazines

i need this paper.please send to me:
n_s5771[at]yahoo.com